Address offset: 0x1020
Test data register.
This register is used to feed known data to the conditioning function or to the continuous tests. When one word is written into this register, the 32-bit are sent to those modules. Since some time is needed for processing, there is one busy flag (TESTDATABUSY in the STATUS register) going high as soon as data is written, and going low when the next word can be written. Write access to this register is ignored when CONTROL.TESTEN is 0. Test data written through this interface is expected to be a multiple of 128 bits.
| Bit number | 31 | 30 | 29 | 28 | 27 | 26 | 25 | 24 | 23 | 22 | 21 | 20 | 19 | 18 | 17 | 16 | 15 | 14 | 13 | 12 | 11 | 10 | 9 | 8 | 7 | 6 | 5 | 4 | 3 | 2 | 1 | 0 | |||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | A | |||
| Reset 0x00000000 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | |||
| ID | R/W | Field | Value ID | Value | Description | ||||||||||||||||||||||||||||||
| A |
W |
TESTDATA |
Test data register. |
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