Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.1

Table 1. Absolute maximum ratings
Note Min. Max. Unit
Supply voltages
VDD -0.3 +3.9 V
VDDH -0.3 +5.8 V
VBUS -0.3 +5.8 V
VSS 0 V
I/O pin voltage
VI/O, VDD ≤3.6 V -0.3 VDD + 0.3 V
VI/O, VDD >3.6 V -0.3 3.9 V
NFC antenna pin current
INFC1/2 80 mA
Radio
RF input level 10 dBm
Environmental aQFN73™ package
Storage temperature -40 +125 °C
MSL Moisture Sensitivity Level 2
ESD HBM Human Body Model 2 kV
ESD HBM Class Human Body Model Class 2
ESD CDM Charged Device Model 450 V
Environmental QFN48 package
Storage temperature -40 +125 °C
MSL Moisture Sensitivity Level 2
ESD HBM Human Body Model 4 kV
ESD HBM Class Human Body Model Class 3A
ESD CDM Charged Device Model 1 kV
Environmental WLCSP 3.544 x 3.607 mm package
Storage temperature -40 +125 °C
MSL Moisture Sensitivity Level 1
ESD HBM Human Body Model 1 kV
ESD HBM Class Human Body Model Class 1C
ESD CDM Charged Device Model 500 V
Flash memory
Endurance 10 000 write/erase cycles
Retention at 85 °C 10 years


1 For accelerated life time testing (HTOL, etc) supply voltage should not exceed the recommended operating conditions max value, see Recommended operating conditions.