Maximum ratings are the extreme limits to which the chip can be exposed for a limited amount of time without permanently damaging it. Exposure to absolute maximum ratings for prolonged periods of time may affect the reliability of the device.
| Min. | Max. | Unit | |
|---|---|---|---|
| Supply voltages | |||
| VDD | -0.3 | +3.9 | V |
| VSS | 0 | V | |
| I/O pin voltage | |||
| VI/O, VDD ≤3.6 V | -0.3 | VDD + 0.3 V | V |
| VI/O, VDD >3.6 V | -0.3 | 3.9 V | V |
| NFC antenna pin current | |||
| INFC1/2 | 80 | mA | |
| Radio | |||
| RF input level | 10 | dBm | |
| Environmental QFN48, 6×6 mm package | |||
| Storage temperature | -40 | +125 | °C |
| MSL (moisture sensitivity level) | 2 | ||
| ESD HBM (human body model) | 4 | kV | |
| ESD CDM (charged device model) | 1000 | V | |
| Environmental WLCSP, 3.0×3.2 mm package | |||
| Storage temperature | -40 | +125 | °C |
| MSL | 1 | ||
| ESD HBM | 2 | kV | |
| ESD CDM | 500 | V | |
| Flash memory | |||
| Endurance | 10 000 | Write/erase cycles | |
| Retention | 10 years at 85°C | ||