nRF70 Series Device Commissioning and Characterization
nRF70 Series Device Commissioning and Characterization
Revision history
Production line operations
Crystal/crystal oscillator frequency trimming
Determine the trim value
Alternative method
MAC address configuration
Program the MAC address
Alternative method
QSPI encryption key
Program the QSPI encryption key
Alternative method
Assembly test
Test method
Alternative method
Characterization lab operations
TX performance
TX power ceilings
Procedure and commands for determining TX power ceilings
RX performance
OTP memory programming
Glossary
Application Programming Interface (API)
Carrier Frequency Offset (CFO)
Complementary Code Keying (CCK)
Cyclic Redundancy Check (CRC)
Device Under Test (DUT)
Direct-sequence Spread Spectrum (DSSS)
Error Vector Magnitude (EVM)
Microcontroller Unit (MCU)
Microprocessor Unit (MPU)
Orthogonal Frequency Division Multiplexing (OFDM)
One Time Programmable (OTP) memory
Packet Error Rate (PER)
Printed Circuit Board (PCB)
Quad Serial Peripheral Interface (QSPI)
Spectrum Analyzer (SA)
Spectral Emission Mask (SEM)
Serial Peripheral Interface (SPI)
System on Chip (SoC)
Vector Signal Analyzer (VSA)
Vector Signal Generator (VSG)
Virtual Network Interface (VIF)
Recommended reading
Legal notices
nan_043.pdf